Hyperspectral microscopy

Hyperspectral microscopy is an imaging technique that combines optical microscopy with spectrally resolved detection, enabling the acquisition of a full spectrum for each spatial pixel of a sample. By collecting information across a broad wavelength range, hyperspectral imaging provides detailed insight into the optical, chemical, and structural properties of materials.

Hyperspectral microscopy is widely used in materials science, biology, semiconductor research, cultural heritage, and photonics, as it enables non-destructive characterization with high spatial and spectral resolution. The technique allows the identification of spectral signatures associated with absorption, reflectance, fluorescence, scattering, and interference phenomena.

When combined with broadband illumination and interferometric spectral acquisition, hyperspectral microscopy can access ultraviolet, visible, and near-infrared spectral regions, enabling the study of electronic transitions, optical resonances, defects, and compositional heterogeneity. Spatially resolved hyperspectral measurements make it possible to map wavelength-dependent properties at the microscale, providing comprehensive chemical and functional imaging of complex samples.

Instrument characteristics

Model: Custom hyperspectral microscope system with GEMINI interferometer (L version)
Microscope: ZEISS Axioscope 5 with modified UV fluorescence path (from 250 nm)
Illumination source: EQ-99X LDLS Energetiq (Hamamatsu)
Objectives: Zeiss 10X / 0.2 NA UV objective
Beam splitter: 50:50 UV beam splitter
Tube lens: UV-optimized tube lens
Sensor: Sony IMX487
Sensor spectral range: 250–1000 nm
Interferometer: Custom GEMINI interferometer, long-delay (L) version, ultrabroadband configuration
Spectral range: 250–3500 nm
Configuration: High-performance hyperspectral imaging system optimized for UV–VIS–NIR operation