Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is a high-resolution scanning probe technique capable of imaging surfaces with sub-nanometer precision-over 1000 times finer than the optical diffraction limit.
AFM enables the measurement of interaction forces between the probe and the sample as a function of their separation, and is widely used for detailed surface characterization, including topography, roughness analysis, and nanoscale mechanical property evaluation.