Microscopy
& Surface Characterization
- Atomic Force Microscope (AFM)
- Scanning Tunneling Microscope (STM)
- Scanning Electron Microscope (SEM) with Auger chemical analysis (20 nm spatial resolution)
- Scanning Near-Field Optical Microscope (SNOM)
- Ultra-high vacuum photoemission systems for chemical-physical analysis of surfaces, interfaces, thin films, and coatings
Spectroscopy &
Laser Systems
Deposition &
Surface Engineering
- Thin-film deposition systems for metallic, semiconductor, and oxide coatings via RF sputtering and electron-beam evaporation
- Supersonic nanoparticle beam source
- Plasma treatment systems (O₂, CH₄, N₂)
Cryogenic &
Magnetic Systems
- Cryostat for cryogenic measurements down to 10 K
- Electromagnets capable of fields up to 1.2 T
Sensors & Material
Response
- Systems for measuring electrical properties of thin films under exposure to pollutant gases and electromagnetic radiation
- Dell PowerEdge 910 server
- 4 CPUs (20-core Intel E7500)
- 256 GB RAM
- 1.5 TB storage
- Dell PowerEdge R7625 server
- 2 CPUs (24-core AMD EPYC 9254)
- 1.28 TB RAM
- 15.36 TB storage
- GPU AMD Instinct MI210
