Atomic Force Microscope
ATOMIC FORCE MICROSCOPY
Atomic force microscopy (AFM) is a very-high-resolution type of scanning probe microscopy, with resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. AFMs can be used to measure the forces between the probe and the sample as a function of their mutual separation, or it can be employed in surface roughness topography studies.
Instrument characteristics
- model: Park NX10 AFM