Università Cattolica del Sacro Cuore

Atomic Force Microscope


Atomic force microscopy (AFM) is a very-high-resolution type of scanning probe microscopy, with resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. AFMs can be used to measure the forces between the probe and the sample as a function of their mutual separation, or it can be employed in surface roughness topography studies.

Instrument characteristics

  • modelPark NX10 AFM

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